prof. RNDr. Ivan Ohlídal, DrSc.

2003

• Expression of the optical constants of chalcogenide thin films using the new parameterization dispersion model

  FRANTA Daniel OHLÍDAL Ivan FRUMAR Miloslav JEDELSKÝ Jaroslav

  Article in Periodical

  Applied Surface Science, year: 2003, volume: 212-213, edition: 1

• Characterization of thin films non-uniform in optical parameters by spectroscopic digital reflectometry

  OHLÍDAL Ivan OHLÍDAL Miloslav KLAPETEK Petr ČUDEK Vladimír JÁKL Miloš

  Article in Periodical

  Proceedings of SPIE, year: 2003, volume: 5182, edition: 2

• Mikroskopie magnetické síly: Aplikace při studiu pevných disků

  ŠILER Martin OHLÍDAL Ivan KLAPETEK Petr

  Article in Periodical

  Československý časopis pro fyziku, year: 2003, volume: 53, edition: 2

• New Dispersion Model of the Optical Constants of the DLC Films

  FRANTA Daniel ZAJÍČKOVÁ Lenka BURŠÍKOVÁ Vilma OHLÍDAL Ivan

  Article in Periodical

  Acta Physica Slovaca, year: 2003, volume: 53, edition: 5

• New Method for the Complete Optical Analysis of Thin Films Nonuniform in Optical Parameters

  OHLÍDAL Miloslav OHLÍDAL Ivan KLAPETEK Petr JÁKL Miloš ČUDEK Vladimír ELIÁŠ Marek

  Article in Periodical

  Japanese Journal of Applied Physics, year: 2003, volume: 42, edition: 7B

• Optical constants of ZnTe and ZnSe epitaxial thin films

  FRANTA Daniel OHLÍDAL Ivan KLAPETEK Petr MONTAIGNE-RAMIL Alberto BONANNI Alberta STIFTER David SITTER Helmut

  Article in Periodical

  Acta Physica Slovaca, year: 2003, volume: 53, edition: 2

• Optical characterization of ZnSe thin films

  FRANTA Daniel OHLÍDAL Ivan KLAPETEK Petr MONTAIGNE-RAMIL Alberto BONANNI Alberta STIFTER David SITTER Helmut

  Article in Proceedings

  19th Congress of the International Commission for Optics: Optics for the Quality of Life, year: 2003

• Optical properties of diamond-like carbon films containing SiOx

  FRANTA Daniel OHLÍDAL Ivan BURŠÍKOVÁ Vilma ZAJÍČKOVÁ Lenka

  Article in Periodical

  Diamond and Related Materials, year: 2003, volume: 12, edition: 9

• Srovnání snímků NSOM a AFM při studiu vybraných objektů

  KLAPETEK Petr OHLÍDAL Ivan

  Article in Periodical

  Československý časopis pro fyziku, year: 2003, volume: 47, edition: 6-7s

• Theoretical analysis of the atomic force microscopy characterization of columnar thin films

  KLAPETEK Petr OHLÍDAL Ivan

  Article in Periodical

  Ultramicroscopy, year: 2003, volume: 94, edition: 1